Tolmachev Vladimir Andreevich

Curriculum vitae

Vladimir Andreevich Tolmachev, Senior Researcher, Dr. Science (Phys.-Math.), PhD (Chemistry) – a specialist in the field of Atomic Layer Deposition (ALD) technology and in the development of applied ellipsometry for characterizing thin films, and the creator of a new adsorption-ellipsometric method to study the properties of porous layers. He participated in international cooperation in the study of photonic crystals as one of the main leaders in the technology of their fabrication from single-crystal silicon, the development of physical models and the solution of theoretical and calculated problems, the spectral studies of the resulting photonic zones, their modification and tuning, as well as resonance effects. Currently, using the simulation of thin-layer and surface structures, conditions are being developed for obtaining a “metal-dielectric” structures on Si and the prediction of their plasmonic properties is being performed, and the calculation part is being adapted to characterize their parameters using spectrоscopic ellipsometry.

Education, degrees: 

• MS, Chemistry (Physical Chemistry), 1977, Leningrad Institute of Technology, Russia
• Postgraduate education (ALD on optical and porous glasses),1982, Leningrad Institute of Technology
• PhD, Chemistry (Physical Chemistry), 1987, Vavilov State Optical Institute, Saint Petersburg, Russia
• Dr.Sci (Phys.-Math.), 2015, University ITMO, Saint Petersburg, Russia

Experience:

• Vavilov State Optical Institute, 1977-1987 Junior Researcher, 1988-1990 Researcher, 1990-2000 Senior Researcher
• Ioffe Physical-Technical Institute of the Russian Academy of Sciences, Saint Petersburg, since 1999 to date

Fields of interest:

• Atomic layer deposition (ALD)
• Applied Ellipsometry (R&D since 1981 year, 51 publications, inclused two reviews )
• Thin solid films and surface layers
• Photonic crystals based on Si
• Tunable Liquid Crystal microresonators on Si cheap
• Plasmonic nanostructures for Si photonics  

Academic Honors

Prize winner of the Ioffe Institute competition for the best work 2005

Projects: European grants: INTAS, MNTC – 2; Russian grants: RFBR – 3  

Visiting

Trinity College, University of Dublin, Ireland  (2002 -2011)

Professional activities and responsibilities   

Referee for journal Optics and Spectroscopy

Patent granted

V.A.Tolmachev, M.A..Okatov,T.V.Leonova The method for determining optical parameters of thin porous films, patent pending N 1695183, Bull. Izobretenii USSR, (1991), N 44.

Selected publications:

1. Y. Zharova, A. Ermina, S. Pavlov, Y. Koshtyal, V. Tolmachev. Spectroscopic Characterization of Silicon Wire-Like and Porous Nanolayers in the Process of Metal-Assisted Chemical Etching of Single-Crystal Silicon, Phys. Status Solidi A, 216, 1900318(1-7) (2019); doi: 10.1002/pssa.201900318
2. Joaquin Faneca  Tatiana S. Perova, Vladimir Tolmachev and Anna Baldycheva. One-Dimensional Multi-Channel  Photonic Crystal Resonators Based on Silicon-On-Insulator With High Quality Factor. Frontiers in Physics. Optics and Photonics, (2018); doi:10.3389/fphy.2018.00060
3. V.A. Tolmachev Optical properties of one-dimensional photonic crystals obtained by micromatchining silicon (a review), Optics and Spectroscopy, v.122, 4  pp. 646-660 (2017)
4. Tatiana S. Perova, Vladimir A. Tolmachev, and Kevin Berwick. Design of Composite and Multi-Component One-Dimensional Photonic Crystal Structures Based on Silicon/Chapter 11, in book «Nanostructured Semiconductors. From base to applications», Eds. P. Granitzer, K. Rumpf / Pan Stanford Publishing Pte Ltd, (2014),  pp. 453-526. DOI: 10.4032/9789814411103.
5. http://www.panstanford.com/books/9789814316903.html]
6. Anna Baldycheva,  Vladimir A. Tolmachev,  Tatiana S. Perova,  Yulia A. Zharova,  Ekaterina V. Astrova,  and Kevin Berwick. Silicon photonic crystal filter with ultra-wide pass-band characteristics, Opt. Lett., (2011), V.36, N10, p.1854-1856
7. V.A. Tolmachev, E.V. Astrova, T.S. Perova, J.A. Zharova, S.A. Grudinkin,  V.A. Melnikov. Electro-tunable in-plane one-dimensional photonic structure based on silicon and liquid crystal, App. Phys. Lett. 90 (2007) 011908
8. V.A. Tolmachev. An adsorption ellipsometric method for studing porous films and coatings (a review), Rus. Microelectronics V.29, No.5, (2000). pp. 374-389.